Elektronisk Dele : SNJ54BCT8373AFK

Producent : Texas Instruments

Packing :

Pins :

Beskrivelse : SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Temperatur : Min °C | Max °C

Datasheet : SNJ54BCT8373AFK PDF

• SNJ54BCT8373AFK
• SNJ54BCT8373AJT
• SNJ54BCT8374AFK
• SNJ54BCT8374AJT